Jongwook Park, Sang-Hoon Shin, Sungju Park. A partial scan design by unifying structural analysis and testabilities. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 88-91, IEEE, 2000. [doi]
@inproceedings{ParkSP00,
title = {A partial scan design by unifying structural analysis and testabilities},
author = {Jongwook Park and Sang-Hoon Shin and Sungju Park},
year = {2000},
doi = {10.1109/ISCAS.2000.857033},
url = {https://doi.org/10.1109/ISCAS.2000.857033},
researchr = {https://researchr.org/publication/ParkSP00},
cites = {0},
citedby = {0},
pages = {88-91},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings},
publisher = {IEEE},
}