Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis - researchr publication authors

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Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi. Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]

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