Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi. Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]
Abstract is missing.