Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi. Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]
@inproceedings{PascaAB11,
title = {Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis},
author = {Vladimir Pasca and Lorena Anghel and Mounir Benabdenbi},
year = {2011},
doi = {10.1109/LATW.2011.5985896},
url = {https://doi.org/10.1109/LATW.2011.5985896},
researchr = {https://researchr.org/publication/PascaAB11},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1490-0},
}