Alessio Di Pasquo, Enrico Monaco, Claudio Nani, Luca Fanucci. Delay-lines jitter modeling and efficiency analysis in FinFET technology. In 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021. pages 1-5, IEEE, 2021. [doi]
@inproceedings{PasquoMNF21,
title = {Delay-lines jitter modeling and efficiency analysis in FinFET technology},
author = {Alessio Di Pasquo and Enrico Monaco and Claudio Nani and Luca Fanucci},
year = {2021},
doi = {10.1109/ICECS53924.2021.9665514},
url = {https://doi.org/10.1109/ICECS53924.2021.9665514},
researchr = {https://researchr.org/publication/PasquoMNF21},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021},
publisher = {IEEE},
isbn = {978-1-7281-8281-0},
}