Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs - researchr publication authors

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Satwik Patnaik, Mohammed Ashraf, Ozgur Sinanoglu, Johann Knechtel. Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs. In Iris Bahar, editor, Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018. pages 8, ACM, 2018. [doi]

This author has not been identified. Look up 'Satwik Patnaik' in GoogleThis author has not been identified. Look up 'Mohammed Ashraf' in GoogleThis author has not been identified. Look up 'Ozgur Sinanoglu' in GoogleThis author has not been identified. Look up 'Johann Knechtel' in Google

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