Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs

Satwik Patnaik, Mohammed Ashraf, Ozgur Sinanoglu, Johann Knechtel. Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs. In Iris Bahar, editor, Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018. pages 8, ACM, 2018. [doi]

@inproceedings{PatnaikASK18,
  title = {Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs},
  author = {Satwik Patnaik and Mohammed Ashraf and Ozgur Sinanoglu and Johann Knechtel},
  year = {2018},
  doi = {10.1145/3240765.3240784},
  url = {https://doi.org/10.1145/3240765.3240784},
  researchr = {https://researchr.org/publication/PatnaikASK18},
  cites = {0},
  citedby = {0},
  pages = {8},
  booktitle = {Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018},
  editor = {Iris Bahar},
  publisher = {ACM},
  isbn = {978-1-4503-5950-4},
}