Robust fault diagnosis in a chemical process using multiple-model approach

Ron John Patton, C. J. Lopez-Toribio, Silvio Simani. Robust fault diagnosis in a chemical process using multiple-model approach. In 40th IEEE Conference on Decision and Control, CDC 2001, Orlando, FL, USA, 4-7 Dec., 2001. pages 149-154, IEEE, 2001. [doi]

Authors

Ron John Patton

This author has not been identified. Look up 'Ron John Patton' in Google

C. J. Lopez-Toribio

This author has not been identified. Look up 'C. J. Lopez-Toribio' in Google

Silvio Simani

This author has not been identified. Look up 'Silvio Simani' in Google