Ron John Patton, C. J. Lopez-Toribio, Silvio Simani. Robust fault diagnosis in a chemical process using multiple-model approach. In 40th IEEE Conference on Decision and Control, CDC 2001, Orlando, FL, USA, 4-7 Dec., 2001. pages 149-154, IEEE, 2001. [doi]
@inproceedings{PattonLS01,
title = {Robust fault diagnosis in a chemical process using multiple-model approach},
author = {Ron John Patton and C. J. Lopez-Toribio and Silvio Simani},
year = {2001},
doi = {10.1109/.2001.980089},
url = {https://doi.org/10.1109/.2001.980089},
researchr = {https://researchr.org/publication/PattonLS01},
cites = {0},
citedby = {0},
pages = {149-154},
booktitle = {40th IEEE Conference on Decision and Control, CDC 2001, Orlando, FL, USA, 4-7 Dec., 2001},
publisher = {IEEE},
isbn = {0-7803-7061-9},
}