Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits - researchr publication authors

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Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy. Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 26(4):743-751, 2007. [doi]

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