Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy. Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 26(4):743-751, 2007. [doi]
Abstract is missing.