Electro-Thermal and Trapping Characterization of AlGaN/GaN RF Power HEMTs - researchr publication authors

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José Pedro, João Gomes, Luis Nunes. Electro-Thermal and Trapping Characterization of AlGaN/GaN RF Power HEMTs. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021. pages 1-6, IEEE, 2021. [doi]

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