José Pedro, João Gomes, Luis Nunes. Electro-Thermal and Trapping Characterization of AlGaN/GaN RF Power HEMTs. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.