M. Pedro, Javier Martín-Martínez, E. Miranda, Rosana Rodríguez, Montserrat Nafría, M. B. González, Francesca Campabadal. Device variability tolerance of a RRAM-based self-organizing neuromorphic system. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 4-1, IEEE, 2018. [doi]
Abstract is missing.