An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations - researchr publication authors

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Zahira Perez, Hector Villacorta, Víctor H. Champac. An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations. In IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona, Italy, October 8-10, 2018. pages 77-82, IEEE, 2018. [doi]

This author has not been identified. Look up 'Zahira Perez' in GoogleThis author has not been identified. Look up 'Hector Villacorta' in GoogleThis author has not been identified. Look up 'Víctor H. Champac' in Google

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