Konstantin O. Petrosyants, Maxim Kozhukhov, Dmitry Popov. Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS LSI's Components using RAD-THERM TCAD Subsystem. In 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2019, Cluj-Napoca, Romania, April 24-26, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.