A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits

Witold A. Pleskacz, Charles H. Ouyang, Wojciech Maly. A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 18(2):151-162, 1999. [doi]

Authors

Witold A. Pleskacz

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Charles H. Ouyang

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Wojciech Maly

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