A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits

Witold A. Pleskacz, Charles H. Ouyang, Wojciech Maly. A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 18(2):151-162, 1999. [doi]

Abstract

Abstract is missing.