A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits

Witold A. Pleskacz, Charles H. Ouyang, Wojciech Maly. A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 18(2):151-162, 1999. [doi]

@article{PleskaczOM99,
  title = {A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits},
  author = {Witold A. Pleskacz and Charles H. Ouyang and Wojciech Maly},
  year = {1999},
  doi = {10.1109/43.743724},
  url = {http://doi.ieeecomputersociety.org/10.1109/43.743724},
  tags = {rule-based, source-to-source, open-source},
  researchr = {https://researchr.org/publication/PleskaczOM99},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {18},
  number = {2},
  pages = {151-162},
}