Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho. CMOS IC diagnostics using the luminescence of OFF-state leakage currents. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 134-139, IEEE, 2004. [doi]
@inproceedings{PolonskyJWC04,
title = {CMOS IC diagnostics using the luminescence of OFF-state leakage currents},
author = {Stas Polonsky and Keith A. Jenkins and Alan J. Weger and Shinho Cho},
year = {2004},
doi = {10.1109/ITC.2004.49},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.49},
tags = {diagnostics},
researchr = {https://researchr.org/publication/PolonskyJWC04},
cites = {0},
citedby = {0},
pages = {134-139},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}