Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho. CMOS IC diagnostics using the luminescence of OFF-state leakage currents. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 134-139, IEEE, 2004. [doi]
@inproceedings{PolonskyJWC04, title = {CMOS IC diagnostics using the luminescence of OFF-state leakage currents}, author = {Stas Polonsky and Keith A. Jenkins and Alan J. Weger and Shinho Cho}, year = {2004}, doi = {10.1109/ITC.2004.49}, url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.49}, tags = {diagnostics}, researchr = {https://researchr.org/publication/PolonskyJWC04}, cites = {0}, citedby = {0}, pages = {134-139}, booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA}, publisher = {IEEE}, isbn = {0-7803-8581-0}, }