Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
W. Polspoel, Wilfried Vandervorst, L. Aguilera, M. Porti, M. Nafría, X. Aymerich. Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors. Microelectronics Reliability, 48(8-9):1521-1524, 2008. [doi]
Abstract is missing.