Irith Pomeranz. FDPIC: Generation of Functional Test Sequences Based on Fault-Dependent Primary Input Cubes. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 308-313, IEEE, 2014. [doi]
@inproceedings{Pomeranz14-7,
title = {FDPIC: Generation of Functional Test Sequences Based on Fault-Dependent Primary Input Cubes},
author = {Irith Pomeranz},
year = {2014},
doi = {10.1109/ISVLSI.2014.23},
url = {http://dx.doi.org/10.1109/ISVLSI.2014.23},
researchr = {https://researchr.org/publication/Pomeranz14-7},
cites = {0},
citedby = {0},
pages = {308-313},
booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014},
publisher = {IEEE},
}