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Irith Pomeranz. FDPIC: Generation of Functional Test Sequences Based on Fault-Dependent Primary Input Cubes. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 308-313, IEEE, 2014. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Sequential Test Generation Based on Preferred Primary Input CubesIrith Pomeranz. tcad, 36(2):351-355, 2017. [doi] Generation of Functional Broadside Tests for Logic Blocks With Constrained Primary Input SequencesIrith Pomeranz. tcad, 32(3):442-452, 2013. [doi] On-chip generation of primary input sequences for multicycle functional broadside testsIrith Pomeranz. iet-cdt, 12(3):80-86, 2018. [doi] Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Functional Test SequencesIrith Pomeranz, Sudhakar M. Reddy. dft 2009: 358-366 [doi]
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