Static Compaction by Merging of Seeds for LFSR-Based Test Generation

Irith Pomeranz. Static Compaction by Merging of Seeds for LFSR-Based Test Generation. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 314-319, IEEE, 2017. [doi]

@inproceedings{Pomeranz17-5,
  title = {Static Compaction by Merging of Seeds for LFSR-Based Test Generation},
  author = {Irith Pomeranz},
  year = {2017},
  doi = {10.1109/ISVLSI.2017.62},
  url = {https://doi.org/10.1109/ISVLSI.2017.62},
  researchr = {https://researchr.org/publication/Pomeranz17-5},
  cites = {0},
  citedby = {0},
  pages = {314-319},
  booktitle = {2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-6762-6},
}