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Irith Pomeranz. Static Compaction by Merging of Seeds for LFSR-Based Test Generation. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 314-319, IEEE, 2017. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Compact Set of Seeds for LFSR-Based Test Generation from a Fully-Specified Compact Test SetIrith Pomeranz. isvlsi 2016: 361-366 [doi] Computation of Seeds for LFSR-Based Diagnostic Test GenerationIrith Pomeranz. tcad, 34(12):2004-2012, 2015. [doi] Computing Seeds for LFSR-Based Test Generation From Nontest CubesIrith Pomeranz. tvlsi, 24(6):2392-2396, 2016. [doi] Compact Set of LFSR Seeds for Diagnostic TestsIrith Pomeranz. vts 2021: 1-7 [doi]
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