Irith Pomeranz. Using piecewise-functional broadside tests for functional broadside test compaction. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{Pomeranz17a-0,
title = {Using piecewise-functional broadside tests for functional broadside test compaction},
author = {Irith Pomeranz},
year = {2017},
doi = {10.1109/VTS.2017.7928944},
url = {https://doi.org/10.1109/VTS.2017.7928944},
researchr = {https://researchr.org/publication/Pomeranz17a-0},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017},
publisher = {IEEE},
isbn = {978-1-5090-4482-5},
}