The following publications are possibly variants of this publication:
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- Piecewise-Functional Broadside Tests Based on Reachable StatesIrith Pomeranz. TC, 64(8):2415-2420, 2015. [doi]
- Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point InsertionIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 16(7):931-936, 2008. [doi]
- On reset based functional broadside testsIrith Pomeranz, Sudhakar M. Reddy. date 2010: 1438-1443 [doi]
- Built-in generation of functional broadside testsIrith Pomeranz. date 2011: 1297-1302 [doi]
- Static test compaction procedure for large pools of multicycle functional broadside testsIrith Pomeranz. iet-cdt, 12(5):233-240, 2018. [doi]
- Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside TestsIrith Pomeranz. tvlsi, 21(7):1359-1363, 2013. [doi]
- Compact Set of Functional Broadside Tests with Fault Detection on Primary OutputsIrith Pomeranz. vts 2023: 1-7 [doi]
- On Functional Broadside Tests With Functional Propagation ConditionsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 19(6):1094-1098, 2011. [doi]
- Covering Test Holes of Functional Broadside TestsIrith Pomeranz. todaes, 26(3), 2021. [doi]
- Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation LinesIrith Pomeranz. itc 2023: 105-110 [doi]
- Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault SimulationIrith Pomeranz. itc 2019: 1-7 [doi]
- Piecewise-functional broadside tests based on intersections of reachable statesIrith Pomeranz. dft 2015: 133-138 [doi]
- Functional Broadside Tests With Incompletely Specified Scan-In StatesIrith Pomeranz. tcad, 32(9):1445-1449, 2013. [doi]