Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs

Irith Pomeranz. Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-7, IEEE, 2023. [doi]

Abstract

Abstract is missing.