Irith Pomeranz. Close-to-Functional Broadside Tests With a Safety Margin. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(12):2139-2143, 2017. [doi]
@article{Pomeranz17e,
title = {Close-to-Functional Broadside Tests With a Safety Margin},
author = {Irith Pomeranz},
year = {2017},
doi = {10.1109/TCAD.2017.2669862},
url = {https://doi.org/10.1109/TCAD.2017.2669862},
researchr = {https://researchr.org/publication/Pomeranz17e},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {36},
number = {12},
pages = {2139-2143},
}