The following publications are possibly variants of this publication:
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- Broadside and Functional Broadside Tests for Partial-Scan CircuitsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 19(6):1104-1108, 2011. [doi]
- Generation of close-to-functional broadside tests with equal primary input vectorsIrith Pomeranz. dac 2015: 137 [doi]
- Using piecewise-functional broadside tests for functional broadside test compactionIrith Pomeranz. vts 2017: 1-6 [doi]
- On reset based functional broadside testsIrith Pomeranz, Sudhakar M. Reddy. date 2010: 1438-1443 [doi]
- Built-in generation of functional broadside testsIrith Pomeranz. date 2011: 1297-1302 [doi]
- Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside TestsIrith Pomeranz. tvlsi, 21(7):1359-1363, 2013. [doi]
- Extracting a Close-to-Minimum Multicycle Functional Broadside Test Set From a Functional Test SequenceIrith Pomeranz. tvlsi, 27(6):1428-1437, 2019. [doi]
- Covering Test Holes of Functional Broadside TestsIrith Pomeranz. todaes, 26(3), 2021. [doi]
- On Functional Broadside Tests With Functional Propagation ConditionsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 19(6):1094-1098, 2011. [doi]
- Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside TestsIrith Pomeranz. iolts 2020: 1-4 [doi]
- Scan Shift Power of Functional Broadside TestsIrith Pomeranz. tcad, 30(9):1416-1420, 2011. [doi]
- Boundary-Functional Broadside and Skewed-Load TestsIrith Pomeranz. todaes, 24(1), 2019. [doi]
- Functional Broadside Tests for Multistep Defect DiagnosisIrith Pomeranz. tcad, 33(9):1429-1433, 2014. [doi]