Irith Pomeranz. Diagnostic Test Generation That Addresses Diagnostic Holes. IEEE Trans. on CAD of Integrated Circuits and Systems, 38(2):335-344, 2019. [doi]
@article{Pomeranz19-0,
title = {Diagnostic Test Generation That Addresses Diagnostic Holes},
author = {Irith Pomeranz},
year = {2019},
doi = {10.1109/TCAD.2018.2812121},
url = {https://doi.org/10.1109/TCAD.2018.2812121},
researchr = {https://researchr.org/publication/Pomeranz19-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {38},
number = {2},
pages = {335-344},
}