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Irith Pomeranz. Diagnostic Test Generation That Addresses Diagnostic Holes. IEEE Trans. on CAD of Integrated Circuits and Systems, 38(2):335-344, 2019. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: New Targets for Diagnostic Test GenerationIrith Pomeranz. tcad, 39(10):3035-3043, 2020. [doi] Output-Dependent Diagnostic Test GenerationIrith Pomeranz, Sudhakar M. Reddy. vlsid 2010: 3-8 [doi]
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