Irith Pomeranz. Storage-Based Built-In Self-Test for Gate-Exhaustive Faults. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(10):2189-2193, 2021. [doi]
@article{Pomeranz21c,
title = {Storage-Based Built-In Self-Test for Gate-Exhaustive Faults},
author = {Irith Pomeranz},
year = {2021},
doi = {10.1109/TCAD.2020.3035133},
url = {https://doi.org/10.1109/TCAD.2020.3035133},
researchr = {https://researchr.org/publication/Pomeranz21c},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {40},
number = {10},
pages = {2189-2193},
}