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Irith Pomeranz. Storage-Based Built-In Self-Test for Gate-Exhaustive Faults. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(10):2189-2193, 2021. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Storage and Counter Based Logic Built-In Self-TestIrith Pomeranz. access, 11:139335-139344, 2023. [doi] A Partitioning and Storage Based Built-In Test Pattern Generation Method for Delay Faults in Scan CircuitsIrith Pomeranz, Sudhakar M. Reddy. ats 2002: 110-115 [doi] Improving a Test Set to Cover Test Holes by Detecting Gate-Exhaustive FaultsIrith Pomeranz. dft 2020: 1-4 [doi] GEPDFs: Path Delay Faults Based on Two-Cycle Gate-Exhaustive FaultsIrith Pomeranz. tcad, 41(7):2315-2322, 2022. [doi]
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