GEPDFs: Path Delay Faults Based on Two-Cycle Gate-Exhaustive Faults

Irith Pomeranz. GEPDFs: Path Delay Faults Based on Two-Cycle Gate-Exhaustive Faults. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(7):2315-2322, 2022. [doi]

Abstract

Abstract is missing.