Irith Pomeranz. Compaction of Compressed Bounded Transparent-Scan Test Sets. In Ioannis Savidis, Avesta Sasan, Himanshu Thapliyal, Ronald F. DeMara, editors, GLSVLSI '22: Great Lakes Symposium on VLSI 2022, Irvine CA USA, June 6 - 8, 2022. pages 339-343, ACM, 2022. [doi]
Abstract is missing.