Irith Pomeranz. Test Sequences for Faults in the Scan Logic. IEEE Trans. VLSI Syst., 30(10):1568-1572, 2022. [doi]
@article{Pomeranz22a-0,
title = {Test Sequences for Faults in the Scan Logic},
author = {Irith Pomeranz},
year = {2022},
doi = {10.1109/TVLSI.2022.3182540},
url = {https://doi.org/10.1109/TVLSI.2022.3182540},
researchr = {https://researchr.org/publication/Pomeranz22a-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {30},
number = {10},
pages = {1568-1572},
}