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Irith Pomeranz. Test Insertion for Dynamic Test Compaction. IEEE Trans. on CAD of Integrated Circuits and Systems, 43(4):1302-1306, April 2024. [doi]

The following publications are possibly variants of this publication:

On the effects of test compaction on defect coverageSudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. vts 1996: 430-437 [doi]

Compact test sets for high defect coverageSudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. tcad, 16(8):923-930, 1997. [doi]

Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point InsertionIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 16(7):931-936, 2008. [doi]

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