Observation Point Placement for Improved Logic Diagnosis based on Large Sets of Candidate Faults

Irith Pomeranz, Vivek Chickermane, Srikanth Venkataraman. Observation Point Placement for Improved Logic Diagnosis based on Large Sets of Candidate Faults. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]

Abstract

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