Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults

Irith Pomeranz, Xijiang Lin. Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults. IEEE Trans. VLSI Syst., 29(2):423-433, 2021. [doi]

Authors

Irith Pomeranz

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Xijiang Lin

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