Irith Pomeranz, Xijiang Lin. Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults. IEEE Trans. VLSI Syst., 29(2):423-433, 2021. [doi]
@article{PomeranzL21, title = {Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults}, author = {Irith Pomeranz and Xijiang Lin}, year = {2021}, doi = {10.1109/TVLSI.2020.3038368}, url = {https://doi.org/10.1109/TVLSI.2020.3038368}, researchr = {https://researchr.org/publication/PomeranzL21}, cites = {0}, citedby = {0}, journal = {IEEE Trans. VLSI Syst.}, volume = {29}, number = {2}, pages = {423-433}, }