On the use of multiple fault detection times in a method for built-in test pattern generation for synchronous sequential circuits - researchr publication authors

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Irith Pomeranz, Sudhakar M. Reddy. On the use of multiple fault detection times in a method for built-in test pattern generation for synchronous sequential circuits. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 144-149, IEEE Computer Society, 2000. [doi]

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