Irith Pomeranz, Sudhakar M. Reddy. On the use of multiple fault detection times in a method for built-in test pattern generation for synchronous sequential circuits. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 144-149, IEEE Computer Society, 2000. [doi]
@inproceedings{PomeranzR00-0,
title = {On the use of multiple fault detection times in a method for built-in test pattern generation for synchronous sequential circuits},
author = {Irith Pomeranz and Sudhakar M. Reddy},
year = {2000},
doi = {10.1109/ETW.2000.873792},
url = {https://doi.org/10.1109/ETW.2000.873792},
researchr = {https://researchr.org/publication/PomeranzR00-0},
cites = {0},
citedby = {0},
pages = {144-149},
booktitle = {5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000},
publisher = {IEEE Computer Society},
isbn = {0-7695-0701-8},
}