Irith Pomeranz, Sudhakar M. Reddy. ITEM: an iterative improvement test generation procedure for synchronous sequential circuits. In Kaushik Roy, Sung-Mo Kang, Cheng-Kok Koh, editors, Proceedings of the 11th ACM Great Lakes Symposium on VLSI 2001, West Lafayette, Indiana, USA, 2001. pages 13-18, ACM, 2001. [doi]
Abstract is missing.