On the Coverage of Delay Faults in Scan Designs with Multiple Scan Chains

Irith Pomeranz, Sudhakar M. Reddy. On the Coverage of Delay Faults in Scan Designs with Multiple Scan Chains. In 20th International Conference on Computer Design (ICCD 2002), VLSI in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings. pages 206-209, IEEE Computer Society, 2002. [doi]

Abstract

Abstract is missing.