A New Approach to Test Generation and Test Compaction for Scan Circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Irith Pomeranz, Sudhakar M. Reddy. A New Approach to Test Generation and Test Compaction for Scan Circuits. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 11000-11005, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Irith Pomeranz' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in Google

runs on WebDSL