Irith Pomeranz, Sudhakar M. Reddy. A New Approach to Test Generation and Test Compaction for Scan Circuits. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 11000-11005, IEEE Computer Society, 2003. [doi]
@inproceedings{PomeranzR03:1, title = {A New Approach to Test Generation and Test Compaction for Scan Circuits}, author = {Irith Pomeranz and Sudhakar M. Reddy}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/date/2003/1870/01/187011000abs.htm}, tags = {testing, systematic-approach}, researchr = {https://researchr.org/publication/PomeranzR03%3A1}, cites = {0}, citedby = {0}, pages = {11000-11005}, booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany}, publisher = {IEEE Computer Society}, isbn = {0-7695-1870-2}, }