On test data compression and n-detection test sets

Irith Pomeranz, Sudhakar M. Reddy. On test data compression and n-detection test sets. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 748-751, ACM, 2003. [doi]

Abstract

Abstract is missing.