Test Data Compression Based on Output Dependence

Irith Pomeranz, Sudhakar M. Reddy. Test Data Compression Based on Output Dependence. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 11186-11187, IEEE Computer Society, 2003. [doi]

Abstract

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