On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan - researchr publication authors

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Irith Pomeranz, Sudhakar M. Reddy. On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan. In 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings. pages 82-84, IEEE Computer Society, 2004. [doi]

This author has not been identified. Look up 'Irith Pomeranz' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in Google

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